• DocumentCode
    2477520
  • Title

    An international intercomparison of quantum-based AC Voltage Standards

  • Author

    Lipe, Thomas E. ; Kinard, Joseph R. ; Tang, Yi-hua ; Filipski, Piotr S.

  • Author_Institution
    Quantum Meas. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    2012
  • fDate
    13-16 May 2012
  • Firstpage
    98
  • Lastpage
    102
  • Abstract
    We report the results of a comparison of quantum-based AC Josephson Voltage Standards (ACJVS) between the National Institute of Standards and Technology (NIST), and the National Research Council, Canada (NRC), using a thermal transfer standard as the traveling standard. Excellent agreement was obtained between NIST and NRC from measurements on the lowest voltage ranges of the thermal transfer standard, indicating that the two ACJVS systems are consistent. This work confirms that the use of the ACJVS as a reference for ac voltage measurements is viable, and these systems can form the basis for ac voltage metrology in the future. This intercomparison was performed as part of SIM Bilateral Comparison SIM.EM-S11, AC-DC Voltage Transfer Difference at Low Voltages using an AC Josephson Voltage Standard.
  • Keywords
    Josephson effect; electric current measurement; voltage measurement; AC voltage measurements; AC voltage metrology; AC-DC voltage transfer; ACJVS; Canada; NIST; NRC; SIM bilateral comparison SIM.EM-S11; current metrology; international intercomparison; national research council; quantum-based AC Josephson voltage standards; thermal transfer standard; Arrays; Calibration; NIST; Power transmission lines; Uncertainty; Voltage measurement; AC-DC Difference; Interlaboratory Comparison; Josephson Voltage Standard; Voltage Measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
  • Conference_Location
    Graz
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4577-1773-4
  • Type

    conf

  • DOI
    10.1109/I2MTC.2012.6229229
  • Filename
    6229229