DocumentCode
2477520
Title
An international intercomparison of quantum-based AC Voltage Standards
Author
Lipe, Thomas E. ; Kinard, Joseph R. ; Tang, Yi-hua ; Filipski, Piotr S.
Author_Institution
Quantum Meas. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
2012
fDate
13-16 May 2012
Firstpage
98
Lastpage
102
Abstract
We report the results of a comparison of quantum-based AC Josephson Voltage Standards (ACJVS) between the National Institute of Standards and Technology (NIST), and the National Research Council, Canada (NRC), using a thermal transfer standard as the traveling standard. Excellent agreement was obtained between NIST and NRC from measurements on the lowest voltage ranges of the thermal transfer standard, indicating that the two ACJVS systems are consistent. This work confirms that the use of the ACJVS as a reference for ac voltage measurements is viable, and these systems can form the basis for ac voltage metrology in the future. This intercomparison was performed as part of SIM Bilateral Comparison SIM.EM-S11, AC-DC Voltage Transfer Difference at Low Voltages using an AC Josephson Voltage Standard.
Keywords
Josephson effect; electric current measurement; voltage measurement; AC voltage measurements; AC voltage metrology; AC-DC voltage transfer; ACJVS; Canada; NIST; NRC; SIM bilateral comparison SIM.EM-S11; current metrology; international intercomparison; national research council; quantum-based AC Josephson voltage standards; thermal transfer standard; Arrays; Calibration; NIST; Power transmission lines; Uncertainty; Voltage measurement; AC-DC Difference; Interlaboratory Comparison; Josephson Voltage Standard; Voltage Measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location
Graz
ISSN
1091-5281
Print_ISBN
978-1-4577-1773-4
Type
conf
DOI
10.1109/I2MTC.2012.6229229
Filename
6229229
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