DocumentCode
2477600
Title
Using ensemble empirical mode decomposition to improve the static fringe analysis in optical testing
Author
Chen, Yu-Ta ; Ou-Yang, Mang ; Wu, Shuen-De ; Lin, Shiou-Gwo ; Kuo, Yi-Ting ; Lee, Cheng-Chung
Author_Institution
Dept. of Opt. Photonics, Nat. Central Univ., Jhongli, Taiwan
fYear
2012
fDate
13-16 May 2012
Firstpage
249
Lastpage
253
Abstract
Static fringe analysis is an important skill to reconstruct the surface profile of the tested optics. The mixed image is simulated by the tilt aberration, and several methods of the reducing mixing fringe are utilized to reconstruct the optical paths difference (OPD) profile of the mixed image. In this paper, we propose the ensemble empirical mode decomposition (EEMD) method to decompose the mixed image into several intrinsic mode functions (IMFs), and then removing one or more IMFs to reduce the influence of the mixing fringe in the mixed image. The procedure of reducing mixing fringe can reconstruct the OPD profile of the mixed image easily. In the simulation, using EEMD to reduce the influence of the mixing fringe, the root mean square (RMS) value of the OPD is 0.081 waves as the residue image subtracted from the OPD profiles of original image. In the experiment, the EEMD method reducing the noise of the mixing fringe has the advantage on the high frequency as spherical aberration.
Keywords
birefringence; optical images; optical noise; optical testing; EEMD method; IMF; OPD profile reconstruction; RMS value; ensemble empirical mode decomposition; intrinsic mode functions; mixed image decomposition; mixing fringe reduction; optical path difference profile reconstruction; optical testing; root mean square value; spherical aberration; static fringe analysis; surface profile reconstruction; Image reconstruction; Lenses; Noise; Noise measurement; Optical filters; Optical interferometry; Optical variables measurement; ensemble empirical mode decomposition; optical testing; static fringe analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location
Graz
ISSN
1091-5281
Print_ISBN
978-1-4577-1773-4
Type
conf
DOI
10.1109/I2MTC.2012.6229233
Filename
6229233
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