Title :
Raman based hepatocellular carcinoma biomarker detection
Author :
Santiago-Cordoba, M.A. ; Romano, P.R. ; MacKay, A. ; Demirel, M.C.
Author_Institution :
Chem. Dept., Pennsylvania State Univ., University Park, PA, USA
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
Highly sensitive and selective biomarker detection is required for early detection of hepatocellular carcinoma (HCC). Disease progression has been shown to correlate with specific fucosylation of a validated HCC serum glycoprotein biomarker, alpha-fetoprotein (AFP) Carbohydrate binding proteins, such as lectins, can be used as diagnostic indicators for monitoring glycosylation changes during disease progression in hepatitis B virus (HBV) or hepatitis C virus (HCV) infected patients. We prepared surface-enhanced Raman spectroscopy (SERS) substrates, which provide controllable, well-organized nanoparticles on the surface, for the analysis of a fucose binding lectin AAL. The SERS based assay provides fast (<;10 s), and reproducible (<;5% variation) detection.
Keywords :
biochemistry; biomedical optical imaging; cancer; cellular biophysics; liver; nanomedicine; nanoparticles; proteins; surface enhanced Raman scattering; AFP fucosylation; HBV; HCC serum glycoprotein biomarker; HCV; Raman based biomarker detection; SERS substrates; alpha fetoprotein; carbohydrate binding proteins; controllable well organized nanoparticles; diagnostic indicators; disease progression; early HCC detection; glycosylation change monitoring; hepatitis B virus; hepatitis C virus; hepatocellular carcinoma biomarker; lectins; selective biomarker detection; sensitive biomarker detection; surface enhanced Raman spectroscopy; Films; Nanobioscience; Nanoparticles; Proteins; Raman scattering; Substrates; Temperature measurement; Carcinoma, Hepatocellular; Glycosylation; Humans; Liver Neoplasms; Sensitivity and Specificity; Spectrum Analysis, Raman; Tumor Markers, Biological;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6090620