Title :
The evolution of test methodologies for high-speed digital communications components
Author :
LeCheminant, G.D.
Author_Institution :
Agilent Technol. Lightwave Div., Santa Rosa, CA, USA
Abstract :
Varied system architectures, strong competition, and a weak marketplace have made the process of Gbit/s component evaluation and verification far more complicated than simply making accurate measurements. While compliance to industry standards is essential, cost is becoming increasingly important, with test being a significant portion of overall cost. This paper compares and contrasts Ethernet and SONET/SDH test strategies for 10 Gbit/s transmission, and takes a forward look to 40 Gbit/s devices.
Keywords :
SONET; digital communication; local area networks; optical receivers; optical transmitters; synchronous digital hierarchy; telecommunication equipment testing; test equipment; 10 Gbit/s; 40 Gbit/s; Ethernet test strategies; SONET/SDH test strategies; component cost; component evaluation; component test; component verification; high-speed digital communications components; industry standard compliance; interoperability; marketplace; system architectures; test methodologies; Clocks; Costs; Digital communication; Ethernet networks; Jitter; Optical receivers; Optical transmitters; SONET; Synchronous digital hierarchy; Testing;
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2002. 24th Annual Technical Digest
Conference_Location :
Monterey, California, USA
Print_ISBN :
0-7803-7447-9
DOI :
10.1109/GAAS.2002.1049060
