DocumentCode :
2477846
Title :
Direct extraction of InGaP/GaAs HBT large signal model
Author :
Raghavan, A. ; Banerjee, B. ; Venkataraman, S. ; Laskar, J.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2002
fDate :
20-23 Oct. 2002
Firstpage :
225
Lastpage :
228
Abstract :
A direct extraction method for a compact InGaP/GaAs HBT CAD large signal model including self-heating effects is presented. The current source model including self-heating effect parameters is directly extracted from measured I-V data using a simple procedure. The distributed base resistance and distributed base-collector capacitance are directly extracted from measured S-parameters using a new technique. The extraction procedure for the model is simple, fast, accurate and inherently minimizes the average squared-error between measured and model data thereby requiring no further optimization after extraction.
Keywords :
III-V semiconductors; S-parameters; circuit CAD; gallium arsenide; gallium compounds; heterojunction bipolar transistors; indium compounds; semiconductor device measurement; semiconductor device models; CAD model; InGaP-GaAs; InGaP/GaAs HBT large signal model; S-parameters; average squared-error minimization; current source model; direct extraction method; distributed base resistance; distributed base-collector capacitance; measured I-V data extraction procedure; optimization; self heating effects; Capacitance measurement; Current measurement; Data mining; Electrical resistance measurement; Equations; Equivalent circuits; Frequency; Gallium arsenide; Heterojunction bipolar transistors; Topology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2002. 24th Annual Technical Digest
Conference_Location :
Monterey, California, USA
ISSN :
1064-7775
Print_ISBN :
0-7803-7447-9
Type :
conf
DOI :
10.1109/GAAS.2002.1049065
Filename :
1049065
Link To Document :
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