DocumentCode :
2477855
Title :
Developing a fast inspection path generation method for an automatic spinneret inspection system
Author :
Chen, Chun-Jen ; Chang, Chun-Li ; Hung, Min-Wei ; Jywe, Wenyuh ; Teng, Yunfeng
Author_Institution :
Instrum. Technol. Res. Center, Nat. Appl. Res. Labs., Hsinchu, Taiwan
fYear :
2012
fDate :
13-16 May 2012
Firstpage :
1452
Lastpage :
1455
Abstract :
There are over 2000 capillaries in one large spinneret. Finding each capillary and designing its inspection path is very important. This paper develops a method of finding all capillaries and auto arranging inspection path that decreases inspection time significantly. The method applies to an existing automatic spinneret inspection which includes a three-axis motorized stage, a telcentric lens, two LED light sources, a CCD camera and a personal computer. This paper tested a large ring-type spinneret using the presented method and system in this paper. Inspecting 2016 capillaries only require approximately 800 s.
Keywords :
CCD image sensors; LED displays; design for manufacture; inspection; lenses; machine tools; spinning (textiles); textile industry; CCD camera; LED light source; automatic spinneret inspection system; capillary; charge-coupled device camera; fast inspection path generation method; inspection path design; inspection time; light emitting diode; personal computer; telcentric lens; textile industry; three-axis motorized stage; time 800 s; Cameras; Charge coupled devices; Inspection; Lenses; Light emitting diodes; Light sources; Production; auto path arrangement; auto scanned path generation; automatic spinneret inspection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location :
Graz
ISSN :
1091-5281
Print_ISBN :
978-1-4577-1773-4
Type :
conf
DOI :
10.1109/I2MTC.2012.6229248
Filename :
6229248
Link To Document :
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