DocumentCode :
2477925
Title :
Hybrid nanorobotic manipulation system inside scanning electron microscope and transmission electron microscope
Author :
Nakajima, Masahiro ; Arai, Fumihito ; Dong, Lixin ; Nagai, Moeto ; Fukuda, Toshio
Author_Institution :
Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Japan
Volume :
1
fYear :
2004
fDate :
28 Sept.-2 Oct. 2004
Firstpage :
589
Abstract :
A hybrid nanorobotic manipulation system, which is integrated with a nanorobotic manipulator inside a transmission electron microscope (TEM) and nanorobotic manipulators inside a scanning electron microscope (SEM), is presented. The new type of nanomanipulation system has high enough resolution to identify nano-scale objects due to the adoption of a TEM, and efficient and rapid nanomanipulations are realized with wide enough working space of the SEM nanomanipulators. The TEM nanomanipulator has been constructed with 4 multi-layer piezoelectric actuators for driving in 3 translational degrees of freedom (DOFs) and a passively driven 3-DOF sample stage through SEM nanorobotic manipulators to perform relatively complex manipulations whereas to keep compact volume to be installed inside the narrow vacuum chamber of a TEM. To show the effectiveness of the system, the interlayer resistance of a destructively fabricated multi-walled carbon nanotube has been measured inside a SEM whereas the telescoping structure formed by pulling out inner layers from outer layers of the tube is observed inside a TEM.
Keywords :
carbon nanotubes; micromanipulators; piezoelectric actuators; scanning electron microscopy; transmission electron microscopy; 3 translational degrees of freedom; SEM; TEM; fabricated multiwalled carbon nanotube; hybrid nanorobotic manipulation system; multilayer piezoelectric actuator; nanorobotic manipulator; nanoscale object identification; scanning electron microscope; telescoping structure; transmission electron microscope; Atomic force microscopy; Carbon nanotubes; Cities and towns; Electrical resistance measurement; Mechanical factors; Mechanical variables measurement; Piezoelectric actuators; Scanning electron microscopy; Systems engineering and theory; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Robots and Systems, 2004. (IROS 2004). Proceedings. 2004 IEEE/RSJ International Conference on
Print_ISBN :
0-7803-8463-6
Type :
conf
DOI :
10.1109/IROS.2004.1389416
Filename :
1389416
Link To Document :
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