• DocumentCode
    2478011
  • Title

    Model Inversion Architectures for Settle Time Applications with Uncertainty

  • Author

    Rigney, Brian P. ; Pao, Lucy Y. ; Lawrence, Dale A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO
  • fYear
    2006
  • fDate
    13-15 Dec. 2006
  • Firstpage
    6518
  • Lastpage
    6524
  • Abstract
    We compare two common model inversion architectures, plant inverse (PI) and closed-loop inverse (CLI), by evaluating their ability to achieve settle time performance improvements. The plant models of interest are discrete-time, single-input single-output (SISO), linear time-invariant (LTI), nonminimum phase (NMP), and uncertain. We use a simple algebraic analysis to show that PI and CLI yield the same desired to actual output dynamics if the plant is minimum phase. Using a stable inverse approximation when the plant is certain but NMP, the same algebraic analysis shows that CLI achieves superior settle time performance relative to PI when the settle boundaries are tight. Simulation and experimental data are used to derive conclusions when the plant is NMP and uncertain. We show that CLI has superior performance over PI for our plant dynamics of interest when low frequency parametric uncertainty is present. For higher frequency unstructured uncertainty, the distinction between the two inversion architectures is negligible
  • Keywords
    algebra; approximation theory; closed loop systems; discrete time systems; linear systems; uncertain systems; algebraic analysis; closed-loop inverse architecture; discrete-time model; inverse approximation; linear time-invariant model; model inversion architectures; nonminimum phase model; plant inverse architecture; single-input single-output model; uncertain model; Actuators; Aerodynamics; Disk drives; Frequency; Magnetic sensors; Position measurement; Time measurement; USA Councils; Uncertainty; Utility programs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 2006 45th IEEE Conference on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-0171-2
  • Type

    conf

  • DOI
    10.1109/CDC.2006.377237
  • Filename
    4177729