• DocumentCode
    2478016
  • Title

    Bandstructure of interdiffused InGaN/GaN quantum well

  • Author

    Cheung, Elaine M T ; Chan, Michael C Y

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
  • fYear
    1998
  • fDate
    29-29 Aug. 1998
  • Firstpage
    66
  • Lastpage
    69
  • Abstract
    Quantum well composition intermixing is a thermal induced interdiffusion of the constituent atoms through the hetero-interface. The intermixed structures created by both impurity induced and impurity-free vacancy promoted processes have recently attracted high attention. In recent years, blue green LEDs and lasers of III-nitride semiconductors have attracted a large amount of interest. This is mainly due to its large bandgap range from 1.89 eV (wurtzite InN) to 3.44 eV (wurtzite GaN). InGaN/GaN single quantum well structures have been used to achieve high lumens blue and green light emitting diodes. In this paper, we present the band structure of a strained InGaN/GaN single quantum well under the influence of interdiffusion. Band structure is a fundamental aspect in determining the electronic and optical properties of the materials such as optical gain, refractive index, absorption, etc.
  • Keywords
    III-V semiconductors; band structure; chemical interdiffusion; gallium compounds; indium compounds; refractive index; semiconductor quantum wells; wide band gap semiconductors; InGaN-GaN; band structure; composition intermixing; interdiffused InGaN/GaN quantum well; light emitting diodes; optical gain; refractive index; strained single quantum well; thermal induced interdiffusion; Atomic beams; Gallium nitride; Light emitting diodes; Optical refraction; Optical variables control; Photonic band gap; Quantum well lasers; Semiconductor impurities; Semiconductor lasers; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1998. Proceedings. 1998 IEEE Hong Kong
  • Conference_Location
    Hong Kong
  • Print_ISBN
    0-7803-4932-6
  • Type

    conf

  • DOI
    10.1109/HKEDM.1998.740189
  • Filename
    740189