Title :
Hierarchical Large Margin Nearest Neighbor Classification
Author :
Chen, Qiaona ; Sun, Shiliang
Author_Institution :
Dept. of Comput. Sci. & Technol., East China Normal Univ., Shanghai, China
Abstract :
Distance metric learning has exhibited its great power to enhance performance in metric related pattern recognition tasks. The recent large margin nearest neighbor classification (LMNN) improves the performance of k-nearest neighbor classification by learning a global distance metric. However, it does not consider the locality of data distributions, which is crucial in determining a proper metric. In this paper, we propose a novel local distance metric learning method called hierarchical LMNN (HLMNN) which first builds a hierarchical structure by grouping data points according to the overlapping ratios defined by us and then learns distance metrics sequentially. Experimental results on real-world data sets including comparisons with the traditional k-nearest neighbor and the state-of-the-art LMNN show the effectiveness of the proposed HLMNN.
Keywords :
learning (artificial intelligence); pattern classification; distance metric learning; hierarchical large margin nearest neighbor classification; overlapping ratios; pattern recognition tasks; Euclidean distance; Glass; Learning systems; Nearest neighbor searches; Pattern recognition; Sun; distance metric learning; global metric; hierarchical structure; k-nearest neighbor; local metric;
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
Print_ISBN :
978-1-4244-7542-1
DOI :
10.1109/ICPR.2010.228