DocumentCode :
2478169
Title :
The PRAISE approach for accelerated transient analysis applied to wire models
Author :
Zaum, Daniel ; Hoelldampf, Stefan ; Olbrich, Markus ; Barke, Erich ; Neumann, Ingmar ; Schmidt, Sebastian
Author_Institution :
Inst. of Microelectron. Syst., Leibniz Univ., Hannover, Germany
fYear :
2009
fDate :
17-18 Sept. 2009
Firstpage :
120
Lastpage :
125
Abstract :
Continuously shrinking design sizes and the integration of digital and analog blocks in a single IC are clearly identifiable trends in today´s microelectronics industry. As both trends increase design complexity and concurrently make the outcome of manufacturing processes less predictable, manufacturing yield is potentially endangered. As a countermeasure, new methodologies for the simulation of mixed-signal-circuits are required. In this paper, we describe a new simulation kernel for the previously presented PRAISE methodology. It accelerates the transient simulation of analog mixed-signal systems by generating and employing abstract circuit models during runtime. We apply the methodology to wire models and discuss results and runtime behavior of different implementations. Furthermore, we present an automated XML-based approach at interfacing PRAISE with arbitrary simulation environments using SystemC.
Keywords :
XML; electronic engineering computing; integrated circuit interconnections; integrated circuit modelling; mixed analogue-digital integrated circuits; transient analysis; PRAISE methodology; SystemC; abstract circuit model; accelerated transient analysis; analog blocks; analog mixed-signal systems; automated XML-based method; digital blocks; mixed-signal-circuit simulation; simulation kernel; wire models; Acceleration; Analog integrated circuits; Circuit simulation; Digital integrated circuits; Manufacturing industries; Manufacturing processes; Microelectronics; Runtime; Transient analysis; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Behavioral Modeling and Simulation Workshop, 2009. BMAS 2009. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-5358-0
Type :
conf
DOI :
10.1109/BMAS.2009.5338876
Filename :
5338876
Link To Document :
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