• DocumentCode
    2478182
  • Title

    Influences of processing technique on electrical characteristics of TVS used in communication systems

  • Author

    Zheng, X.R. ; Liu, B.Y. ; Li, Bin ; Lai, P.T.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
  • fYear
    1998
  • fDate
    29-29 Aug. 1998
  • Firstpage
    109
  • Lastpage
    112
  • Abstract
    An improved technique is proposed in fabricating a semiconductor surge protection device which is used in high-speed wideband information transmission systems. In order to increase the surge handling capability of the device, a double p-type diffusion is used. Specifically, in the diffusion step of gallium, SiO 2 is used as a mask to obtain a very small base width and to avoid the reduction of carrier lifetime. It is found that this is a very useful way to reduce the on-state voltage drop and therefore the energy dissipation of the device.
  • Keywords
    carrier lifetime; diffusion; elemental semiconductors; gallium; semiconductor doping; silicon; surge protection; Si:Ga; SiO/sub 2/ mask; carrier lifetime; communication system; double p-type diffusion; electrical characteristics; energy dissipation; high-speed wideband information transmission; on-state voltage drop; semiconductor surge protection device; transient voltage suppressor; Bidirectional control; Capacitance; Electric variables; Energy dissipation; III-V semiconductor materials; Silicon devices; Surge protection; Switches; Voltage; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1998. Proceedings. 1998 IEEE Hong Kong
  • Conference_Location
    Hong Kong
  • Print_ISBN
    0-7803-4932-6
  • Type

    conf

  • DOI
    10.1109/HKEDM.1998.740199
  • Filename
    740199