• DocumentCode
    2478395
  • Title

    Analysis and extraction of parametric variation effects on microelectrofluidics-based biochips

  • Author

    Liu, Bao

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Texas, San Antonio, TX, USA
  • fYear
    2009
  • fDate
    17-18 Sept. 2009
  • Firstpage
    60
  • Lastpage
    65
  • Abstract
    Microfluidic biochips require continued online test to ensure their functionality, performance, and reliability in the presence of runtime parametric variation and system wear-out. Previous techniques locate catastrophic defects which guide subsequent droplet scheduling and routing procedures. However, a significant number of defects on a microfluidic biochip are parametric variations, taking them as catastrophic defects leads to incorrectly identified defect locations, which compromises droplet scheduling and routing. This paper presents the first characterization method for continous droplet movement after passing a faulty cell on a microfluidic biochip in the presence of parametric variations, and the first microfluidic biochip parametric variation extraction method locating the critical cells which originate un-recoverable droplet speed loss. The proposed techniques provide better characterization of parametric variations in droplet movement, and enable performance optimization in droplet scheduling and routing on a microfluidic biochip.
  • Keywords
    bioMEMS; cellular biophysics; lab-on-a-chip; optimisation; continous droplet movement; critical cells; faulty cell; microelectrofluidics-based biochips; microfluidic biochip parametric variation extraction method; optimisation; parametric variation effects; unrecoverable droplet speed loss; Circuit faults; Circuit testing; Electrodes; Microfluidics; Micromechanical devices; Optimization; Routing; System testing; Transportation; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Behavioral Modeling and Simulation Workshop, 2009. BMAS 2009. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-5358-0
  • Type

    conf

  • DOI
    10.1109/BMAS.2009.5338886
  • Filename
    5338886