DocumentCode :
247846
Title :
Full-wave optimization of nitride-based resonant-tunneling diodes for terahertz amplification
Author :
Tenneti, S. ; Nahar, Niru K. ; Volakis, J.L.
Author_Institution :
Electr. & Comput. Eng. Dept., Ohio State Univ., Columbus, OH, USA
fYear :
2014
fDate :
6-11 July 2014
Firstpage :
2016
Lastpage :
2017
Abstract :
Resonant tunneling diode (RTD) structures have the potential to counteract plasmonic losses and thus enhance the gain performance of terahertz (THz) devices. Of particular interest are nitride-based devices, as their high breakdown voltages and capability of large voltage swing gives distinct advantages over Si-based technologies. In this paper, several resonant tunneling diode (RTD) configurations are modeled using FDTD techniques coupled with charge transport equations for completeness. The gain amplifications when integrated with a GaN HEMT are validated using reference measured data. Initial results show resonances up to 2.25 THz and gain improvements up to ~6 dB.
Keywords :
III-V semiconductors; amplification; finite difference time-domain analysis; gallium compounds; high electron mobility transistors; nitrogen; plasmonics; resonant tunnelling diodes; semiconductor device breakdown; semiconductor device models; submillimetre wave diodes; terahertz wave devices; wide band gap semiconductors; FDTD techniques; GaN; HEMT; RTD structures; THz devices; breakdown voltages; charge transport equations; full-wave optimization; gain amplifications; nitride-based devices; nitride-based resonant-tunneling diodes; plasmonic losses; reference measured data; silicon-based technology; terahertz amplification; terahertz devices; voltage swing; Equations; Gain; Gallium nitride; HEMTs; Mathematical model; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2014 IEEE
Conference_Location :
Memphis, TN
ISSN :
1522-3965
Print_ISBN :
978-1-4799-3538-3
Type :
conf
DOI :
10.1109/APS.2014.6905335
Filename :
6905335
Link To Document :
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