DocumentCode :
2478699
Title :
Evaluation of chromatic dispersion in erbium-doped fibers
Author :
Gasper, D.S. ; Wysocki, P.F. ; Reed, W.A. ; Vengsarkar, A.M.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
fYear :
1993
fDate :
15-18 Nov 1993
Firstpage :
167
Lastpage :
168
Abstract :
Transoceanic fiber optic systems that use erbium doped fiber amplifiers(EDFAs) require careful tailoring of chromatic dispersion along the length of the span. One of the parameters of interest to system designers is the additional chromatic dispersion introduced by the erbium ions in the EDFA. The effect of resonant chromatic dispersion due to erbium is also evident in the performance of short length fiber devices such as soliton lasers. Several methods have been used in the past to measure erbium-induced chromatic dispersion. Specifically, Fourier transform spectroscopy and the use of complex atomic susceptibility have been successfully demonstrated. In this paper, we evaluate the complex atomic susceptibility of these fibers with different dopant levels and derive the total dispersion (waveguide and material) of these fibers as a function of wavelength in the 1550 nm range
Keywords :
Fourier transform spectroscopy; erbium; fibre lasers; infrared spectroscopy; optical cables; optical fibre communication; optical fibre dispersion; optical fibre testing; optical susceptibility; submarine cables; 1550 nm; 1550 nm range; EDFAs; Fourier transform spectroscopy; additional chromatic dispersion; chromatic dispersion; complex atomic susceptibility; dopant levels; erbium doped fiber amplifiers; erbium ions; erbium-doped fibers; erbium-induced chromatic dispersion; resonant chromatic dispersion; short length fiber devices; soliton lasers; system designers; total dispersion; transoceanic fiber optic systems; Atomic beams; Atomic measurements; Chromatic dispersion; Doped fiber amplifiers; Erbium; Erbium-doped fiber amplifier; Optical fiber amplifiers; Optical fiber devices; Optical fibers; Semiconductor optical amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-1263-5
Type :
conf
DOI :
10.1109/LEOS.1993.379087
Filename :
379087
Link To Document :
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