Title :
Polarization coupling in y-cut titanium in-diffused lithium niobate planar waveguides
Author :
Kwiatkowski, S.L. ; Hjelme, D.R. ; Wagner, K.H. ; Mickelson, A.R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
Abstract :
This paper describes polarization coupling in Ti:LiNbO3 waveguides: a source of polarization dependent loss and potentially a source of noise in integrated-optical devices. We are developing a methodology for the fabrication and testing of waveguide lenses made by titanium in-diffusion and proton-exchange in y-cut lithium niobate. One unexpected result of this work has been the observation of polarization coupling in Ti:LiNbO3 slab waveguides. When transverse electric field (TE) polarized light is coupled into waveguide modes propagating along the crystal´s x-axis, transverse magnetic field (TM) radiation modes radiate from the waveguide sample. Since this polarization coupling occurs for a propagation direction that is along the crystal axis, the observed TM radiation can be distinguished from the TM radiation that would result from leaky modes propagating off-axis in an anisotropic waveguide. When the polarization of the input was changed to TM, we did not observe polarization coupling into TE polarized radiation modes
Keywords :
ion exchange; lenses; light polarisation; lithium compounds; optical couplers; optical fabrication; optical losses; optical planar waveguides; optical testing; optical waveguide components; titanium; LiNbO3:Ti; fabrication; integrated-optical devices; planar waveguides; polarization coupling; polarization dependent loss; slab waveguides; testing; transverse electric field polarized light; transverse magnetic field radiation modes; waveguide lenses; waveguide modes; Lenses; Lithium niobate; Optical coupling; Optical device fabrication; Optical polarization; Optical propagation; Slabs; Tellurium; Testing; Titanium;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-1263-5
DOI :
10.1109/LEOS.1993.379097