DocumentCode :
2478969
Title :
An analytical study of relay neuron´s reliability: Dependence on input and model parameters
Author :
Agarwal, Rahul ; Sarma, Sridevi V.
Author_Institution :
Dept. of Biomed. Eng., Johns Hopkins Univ., Baltimore, MD, USA
fYear :
2011
fDate :
Aug. 30 2011-Sept. 3 2011
Firstpage :
2426
Lastpage :
2429
Abstract :
Relay neurons are widely found in our nervous system, including the Thalamus, spinal cord and lateral geniculate body. They receive a modulating input (background activity) and a reference input. The modulating input modulates relay of the reference input. This modulation is critical for correct functioning of relay neurons, but is poorly understood. In this paper, we use a biophysical-based model and systems theoretic tools to calculate how well a single relay neuron relays a reference input signal as a function of the neuron´s electro physiological properties (i.e. model parameters), the modulating signal, and the reference signal parameters. Our analysis is more rigorous than previous related works and is generalizable to all relay cells in the body. Our analytical expression matches relay performance obtained in simulation and suggest that increasing the frequency of a sinusoidal modulating input or decreasing its DC offset increases the relay cell reliability.
Keywords :
bioelectric phenomena; cellular biophysics; neurophysiology; reliability; DC offset; biophysical-based model; lateral geniculate body; model parameters; modulating signal; nervous system; neuron electrophysiological properties; reference signal parameters; relay cell reliability; relay neuron reliability; single relay neuron; sinusoidal modulating input; spinal cord; thalamus; Biological system modeling; Computational modeling; Neurons; Orbits; Relays; Reliability; Steady-state; Action Potentials; Animals; Computer Simulation; Humans; Interneurons; Models, Neurological; Synaptic Transmission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2011.6090675
Filename :
6090675
Link To Document :
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