Title :
Extended local binary pattern fusion for face recognition
Author :
Li Liu ; Fieguth, P. ; Guoying Zhao ; Pietikainen, M.
Author_Institution :
Sch. of Inf. Syst. & Manage., Nat. Univ. of Defense Technol., Changsha, China
Abstract :
This paper presents a simple, novel, yet highly effective approach for robust face recognition. Given LBP-like descriptors based on local accumulated pixel differences, Angular Differences (AD) and Radial Differences (RD), the local differences are decomposed into complementary components of signs and magnitudes. The proposed descriptors have desirable features: (1) robustness to lighting, pose, and expression; (2) computation efficiency; (3) encoding of both microstructures and macrostructures; (4) consistent in form with traditional LBP, thus inheriting the merits of LBP; and (5) no required training, improving generalizability. From a given face image, we obtain six histogram features, each of which is obtained by concatenating spatial histograms extracted from nonoverlapping subregions. The Whitened PCA technique is used for dimensionality reduction, followed by Nearest Neighbor classification. We have evaluated the effectiveness of the proposed method on the Extended Yale B and CAS-PEAL-R1 databases. The proposed method impressively outperforms other well known systems, including what we believe to be the best reported performance for the the CAS-PEAL-R1 lighting probe set with a recognition rate of 72.3%.
Keywords :
binary codes; face recognition; feature extraction; image fusion; principal component analysis; vocabulary; AD; CAS-PEAL-R1 databases; LBP-like descriptors; RD; angular differences; computation efficiency; dimensionality reduction; encoding; expression features; extended local binary pattern fusion; extended yale B databases; face image recognition; generalizability improvement; lighting probe set; local accumulated pixel differences; macrostructures; microstructures; nearest neighbor classification; nonoverlapping subregion extraction; pose features; radial differences; signs and magnitude complementary components; spatial histogram feature extraction; whitened PCA technique; Databases; Face; Face recognition; Histograms; Lighting; Probes; Vectors; Face recognition; Feature extraction; Local binary pattern; Local descriptors;
Conference_Titel :
Image Processing (ICIP), 2014 IEEE International Conference on
Conference_Location :
Paris
DOI :
10.1109/ICIP.2014.7025144