• DocumentCode
    2479518
  • Title

    Impedance changes according to the degree of atopi dermatitis in mice

  • Author

    Kim, Soo C. ; Park, Hyun S. ; Kim, Sung M. ; Park, Jung K.

  • Author_Institution
    Grad. Program in Bio & Inf. Technol., Hankyung Nat. Univ., Anseong, South Korea
  • fYear
    2011
  • fDate
    Aug. 30 2011-Sept. 3 2011
  • Firstpage
    2526
  • Lastpage
    2529
  • Abstract
    Variations in electrical impedance over frequency might be used to distinguish the degree of atopic dermatitis (AD), even if the mechanisms of the skin barrier impairment due to AD are still unknown. We observed the skin bioimpedance of normal mice and of abnormal mice having atopic with instrument measuring electrical impedance. Electrical impedance was measured from 20Hz to 1MHz at many frequencies and normalized with several indices such as IMP, PIX, IMIX, RIX, and et al. to reduce variation in subjects. The results showed the high relationship between subjective score and indices, especially, the capacitance change and impedance ratio, abs(Z1kHz)/abs(Z10kHz). These results indicate electrical impedance may be a promising clinical diagnostic tool to monitor prognosis of skin care for atopic dermatitis. Using developed software application we easily acquired complex impedance data from the instrument and got the analysis results for very kinds of frequency. This may be useful in various bioimpedance studies such as skin cancer assessment or body composition analysis, or etc.
  • Keywords
    bioelectric phenomena; electric impedance measurement; medical disorders; skin; IMIX index; IMP index; PIX index; RIX index; atopic dermatitis; electrical impedance change; mice; skin barrier impairment; Capacitance; Frequency measurement; Impedance; Impedance measurement; Instruments; Mice; Skin; Animals; Dermatitis, Atopic; Electric Impedance; Male; Mice;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4121-1
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2011.6090699
  • Filename
    6090699