Title :
Multiple temporal pattern detection and predictability analysis of complex time-evolving systems
Author :
Feng, Xin ; Senyana, Odilon K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Marquette Univ., Milwaukee, WI
Abstract :
This paper presents a new method, called multiple temporal pattern recognition (MTPR), that is capable of detecting multiple temporal patterns for characterizing and predicting events of interest in the time-evolving system data. The MTPR method embeds time series data into multiple phase spaces with various dimensions and time delays. Then it clusters the embedded data to detect the preliminary temporal patterns. We further performed a three-stage statistical predictability analysis to evaluate the confidence of the detected temporal patterns. At the first stage, we introduced a new predictability measure, pm, to evaluate the temporal patterns and then apply the statistical logistical regression to further validate these patterns. Experimental results are also included to illustrate the MTPR method.
Keywords :
delays; large-scale systems; pattern recognition; regression analysis; complex time-evolving systems; multiple phase spaces; multiple temporal pattern detection; multiple temporal pattern recognition; predictability analysis; statistical logistical regression; three-stage statistical predictability analysis; time delays; time-evolving system data; Automation; Clustering algorithms; Data mining; Delay effects; Event detection; Intelligent control; Pattern analysis; Pattern recognition; Performance analysis; Performance evaluation; Phase Space Embedding; Predictability Analysis; Statistical Logistic Regression; Temporal Pattern; Time Series Data Mining;
Conference_Titel :
Intelligent Control and Automation, 2008. WCICA 2008. 7th World Congress on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4244-2113-8
Electronic_ISBN :
978-1-4244-2114-5
DOI :
10.1109/WCICA.2008.4593132