Title :
Transient Measurements With A Photoconductively Gated Scanning Tunneling Microscope
Author :
Keil, Ulrich D. ; Jensen, Jacob R. ; Hvam, Jørn M.
Author_Institution :
Mikroelektronik Centret
Keywords :
Coplanar waveguides; Delay; Laser excitation; Microscopy; Photoconductivity; Power system transients; Probes; Switches; Tunneling; Voltage;
Conference_Titel :
Microwave Photonics, 1997. MWP '97. International Topical Meeting on
Conference_Location :
Duisburg, Germany
Print_ISBN :
4-88552-187-4
DOI :
10.1109/MWP.1997.740282
