DocumentCode :
2479715
Title :
A new free-space calibration technique for materials measurement
Author :
Bartley, Philip G., Jr. ; Begley, Shelley B.
Author_Institution :
Innovative Meas. Solutions, Inc., Portsmouth, VA, USA
fYear :
2012
fDate :
13-16 May 2012
Firstpage :
47
Lastpage :
51
Abstract :
A new method for performing a full two-port s-parameter calibration in free-space is presented. The proposed calibration technique computes the error coefficients from measurements made on an empty fixture and a measurement made on a metal plate of known thickness. Time-domain gating was employed. This technique requires fewer and simpler standards than the existing thru-reflect-line (TRL) and thru-reflect-match (TRM) calibration techniques. It requires the same calibration standards as the gated-reflect-line (GRL) method but doesn´t require performing a coaxial or waveguide calibration at the end of the cables connected to the antennas. Permittivity calculated from measurements, calibrated using this technique, made on a material sample appear to be superior to results published using the TRL and TRM calibration technique and the same as those for a GRL calibration.
Keywords :
S-parameters; antennas; calibration; permittivity measurement; time-domain analysis; GRL calibration method; TRL; TRM; antennas; coaxial waveguides; free-space calibration technique; gated-reflect-line method; material measurement; thru-reflect-line calibration technique; thru-reflect-match calibration technique; time-domain gating; two-port S-parameter calibration; waveguide calibration; Calibration; Fixtures; Materials; Metals; Permittivity measurement; Reflection; Transmission line measurements; Network analyzer calibration; calibration; dielectric; free-space measurements; material measurement; permittivity; s-parameters; time domain; time domain gating;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location :
Graz
ISSN :
1091-5281
Print_ISBN :
978-1-4577-1773-4
Type :
conf
DOI :
10.1109/I2MTC.2012.6229351
Filename :
6229351
Link To Document :
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