DocumentCode
2480
Title
Surface Roughness and Microwave Surface Scattering of High-Resolution Imaging Radar
Author
Park, Sang-Eun ; Ferro-Famil, L. ; Allain, Sophie ; Pottier, Eric
Author_Institution
Dept. of Geoinf. Eng., Sejong Univ., Seoul, South Korea
Volume
12
Issue
4
fYear
2015
fDate
Apr-15
Firstpage
756
Lastpage
760
Abstract
This study aims to understand the effects of spatial resolution on the surface backscattering characteristics of polarimetric radar. Surface scattering models based on approximate methods are formulated by the roughness second-order statistics to obtain a closed-form expression for the radar scattering response. Most studies have been carried out based on the roughness parameters of the infinite surface. In this letter, we propose the roughness autocorrelation function of truncated surfaces for a more realistic description of the roughness parameters of high-resolution radar. The use of roughness parameters for a truncated surface in the scattering model is pertinent to explain the dependence of the backscattering coefficient on the spatial resolution. Simulation results indicate that the traditional computation of the surface backscattering based on the autocovariance function of an infinite surface leads to an underestimation of the backscattering signature of the high-resolution radar.
Keywords
geophysical equipment; radar polarimetry; statistics; surface roughness; surface scattering; approximate method; closed-form expression; high-resolution imaging radar microwave surface scattering; high-resolution imaging radar surface roughness; high-resolution radar backscattering signature underestimation; infinite surface autocovariance function; infinite surface roughness parameter; polarimetric radar; radar scattering response; roughness second-order statistics; spatial resolution backscattering coefficient dependence; spatial resolution effect; surface backscattering characteristic; surface backscattering traditional computation; surface scattering model; truncated surface roughness autocorrelation function; Backscatter; Radar imaging; Rough surfaces; Scattering; Spatial resolution; Surface roughness; Imaging radar; spatial resolution; surface roughness; surface scattering model;
fLanguage
English
Journal_Title
Geoscience and Remote Sensing Letters, IEEE
Publisher
ieee
ISSN
1545-598X
Type
jour
DOI
10.1109/LGRS.2014.2361144
Filename
6928474
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