Optoelectronic device reliability

A great deal of progress has been achieved in the last two decades on the reliability of AlGaAs/GaAs and InGaAsP/InP optoelectronic devices. The progress has led to a wide variation of applications for optoelectronic devices. The application fields prevail from fiber transmission systems to consumer electronics. Now, the functions and applications of optoelectronic devices, in the research and development stage, are changing to such things as monolithically integrated devices and pumping sources of fiber amplifiers. In these situations, new reliability problems have begun to appear, although most physical mechanisms are essentially the same as those clarified in the AlGaAs/GaAs and InGaAsP/InP optoelectronic devices. In this paper, the new reliability problems will be discussed based on the degradation mechanisms and reliability of those optoelectronic devices. The key words in these new reliability problems are strain, high power, and integration