Thermoelectric properties of multi-layered system

Author

Nishio, Y. ; Hirano, T.

Author_Institution

MEC Lab, Daikin Ind. Ltd., Tsukuba, Japan

fYear

1998

fDate

24-28 May 1998

Firstpage

111

Lastpage

114

Abstract

Thermoelectric properties of multi-layered system is investigated theoretically. It is shown that the figure of merit can be improved by eliminating the contributions from low energy carriers to transport processes. Thus the barrier layers which enhance the low energy scattering can be used to eliminate the contributions from the low energy carriers. Appropriate thickness of the barrier layer is estimated by using transmission probability for a single potential barrier. Scattering probability due to multiple potential barriers are derived intuitively and transport coefficients are calculated based on this scattering probability

Keywords

multilayers; surface scattering; thermoelectricity; barrier layers; figure of merit; low energy carriers; low energy scattering; multi-layered system; multiple potential barriers; scattering probability; single potential barrier; thermoelectric properties; thickness; transmission probability; transport coefficients; transport processes; Chemicals; Conductivity; Grain boundaries; Laboratories; Probability; Reactive power; Scattering; Sputtering; Thermoelectricity; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on

Conference_Location

Nagoya

ISSN

1094-2734

Print_ISBN

0-7803-4907-5

Type

conf

DOI

10.1109/ICT.1998.740330

Filename

740330