Title : 
Isometric deformation modeling using singular value decomposition for 3D expression-invariant face recognition
         
        
            Author : 
Smeets, Dirk ; Fabry, Thomas ; Hermans, Jeroen ; Vandermeulen, Dirk ; Suetens, Paul
         
        
            Author_Institution : 
Dept. of Electr. Eng., K.U. Leuven, Leuven, Belgium
         
        
        
        
        
        
            Abstract : 
Currently, the recognition of faces under varying expressions is one of the main challenges in the face recognition community. In this paper a method is presented dealing with those expression variations by using an isometric deformation model. The method is built upon the geodesic distance matrix as a representation of the 3D face. We will show that the set of largest singular values is an excellent expression-invariant shape descriptor. Face comparison is performed by comparison of their shape descriptors using the mean normalized Manhattan distance as dissimilarity measure. The presented method is validated on a subset of 900 faces of the BU-3DFE face database resulting in an equal error rate of 13.37% for the verification scenario. This result is comparable with the equal error rates of other 3D expression-invariant face recognition methods using an isometric deformation model on the same database.
         
        
            Keywords : 
differential geometry; face recognition; singular value decomposition; 3D expression-invariant face recognition; BU-3DFE face database; Manhattan distance; expression-invariant shape descriptor; face comparison; geodesic distance matrix; isometric deformation modeling; singular value decomposition; Databases; Deformable models; Error analysis; Face recognition; Level measurement; Nose; Performance evaluation; Principal component analysis; Shape measurement; Singular value decomposition;
         
        
        
        
            Conference_Titel : 
Biometrics: Theory, Applications, and Systems, 2009. BTAS '09. IEEE 3rd International Conference on
         
        
            Conference_Location : 
Washington, DC
         
        
            Print_ISBN : 
978-1-4244-5019-0
         
        
            Electronic_ISBN : 
978-1-4244-5020-6
         
        
        
            DOI : 
10.1109/BTAS.2009.5339015