Programmable calibration circuit for a MIM-ISFET device

Author

Guerrero, E. ; Sanz-Pascual, M.T. ; Molina-Reyes, J. ; Medrano, N. ; Calvo, B. ; Antolín, D.

Author_Institution

Electron. Dept., INAOE, Puebla, Mexico

fYear

2012

fDate

13-16 May 2012

Firstpage

1819

Lastpage

1822

Abstract

A programmable calibration circuit for sensors is proposed in this paper, which carries out an offset compensation by adding an appropriate correction factor to the transfer function of each sensor. The circuit was designed for a specific sensor structure, a MIM-ISFET, which was modeled in HSpice. The proposed scheme reduces the offset error due to process variations of both the sensor and the interface circuit from 13% to 2% at the minumim pH level and from 13% to 4% in the whole sensing range. The circuit was designed in a 0.18μm standard CMOS process, occupies an area of 115 × 62 μm² and consumes 1.6mW.

Keywords

CMOS integrated circuits; MIM devices; SPICE; calibration; programmable circuits; HSpice; MIM-ISFET device; interface circuit; minumim pH level; offset compensation; offset error; programmable calibration circuit; standard CMOS process; Calibration; Electric potential; Integrated circuit modeling; Intelligent sensors; Logic gates; Semiconductor device modeling; ISFET; sensor calibration; signal conditioning;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International

Conference_Location

Graz

ISSN

1091-5281

Print_ISBN

978-1-4577-1773-4

Type

conf

DOI

10.1109/I2MTC.2012.6229398

Filename

6229398