Title : 
Effect of microstructure and composition on thermoelectric properties of Te-rich Sb2Te3
         
        
            Author : 
Kohri, H. ; Chen, L. ; Nishida, I.A. ; Hirai, T.
         
        
            Author_Institution : 
Inst. of Mater. Res., Tohoku Univ., Sendai, Japan
         
        
        
        
        
        
            Abstract : 
The effect of excess tellurium, including tellurium content and its dispersion state, on the thermoelectric properties of Te-rich Sb2Te3 was studied. The Sb2Te3  boules with 60~90 mass%Te were grown by Bridgman-Stockbarger method and identified by means of X-ray diffraction (XRD). The microstructure and Sb-distribution in the boules were observed by SEM and EPMA. The boules containing from 60 to 61.9 mass%Te were a single phase of Sb2Te3, while the boules containing more than 62 mass%Te consisted of Sb2Te3 phase and eutectic phase with Te-Sb2Te3 lamella structure, and the boule containing 90.7 mass%Te was only Te-Sb2Te3  lamella structure. Hall coefficient and electrical resistivity ρ were measured over the temperature range from 100 to 500 K. Seebeck coefficient σ was measured over the temperature range from 300 to 500 K. Hall concentration of a boule with 60.7 mass% was of 1.09×1026/m3 at room temperature. Hall concentration decreased with increasing Te contents. The boule containing 70.0 mass%Te showed a largest α 2/ρ value of 7.05×10-3 W/(K2m) at 350 K
         
        
            Keywords : 
Hall effect; Seebeck effect; X-ray diffraction; antimony compounds; carrier density; crystal growth from melt; crystal microstructure; electrical resistivity; electron probe analysis; scanning electron microscopy; semiconductor growth; semiconductor materials; stoichiometry; 300 to 500 K; Bridgman-Stockbarger method; EPMA; Hall coefficient; SEM; Sb2Te3; Sb2Te3 phase; Seebeck coefficient; Te-Sb2Te3 lamella structure; Te-rich Sb2Te3; X-ray diffraction; XRD; composition; dispersion state; electrical resistivity; eutectic phase; excess tellurium; microstructure; thermoelectric properties; Dispersion; Electric resistance; Electric variables measurement; Microstructure; Tellurium; Temperature distribution; Temperature measurement; Thermoelectricity; X-ray diffraction; X-ray scattering;
         
        
        
        
            Conference_Titel : 
Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
         
        
            Conference_Location : 
Nagoya
         
        
        
            Print_ISBN : 
0-7803-4907-5
         
        
        
            DOI : 
10.1109/ICT.1998.740347