Title :
The effects of different demagnetisation processes on interactionseffects in thin film media
Author :
El-Hilo, M. ; O´Grady, K. ; Mayo, P.I. ; Chantrell, R.W. ; Sanders, I.L. ; Howard, J.K.
Author_Institution :
SEES
Keywords :
Chromium; Demagnetization; Magnetic field measurement; Magnetic films; Magnetic variables measurement; Model driven engineering; Remanence; Saturation magnetization; Sputtering; Transistors;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696667