• DocumentCode
    2481002
  • Title

    Research on Uncertainty Measurement for Covering Rough-Vague Set

  • Author

    Xu, Jiucheng ; Zhang, Qianqian ; Hu, Yuwen

  • Author_Institution
    Coll. of Comput. & Inf. Technol., Henan Normal Univ., Xinxiang, China
  • fYear
    2010
  • fDate
    22-23 May 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, by the research of covering rough set theory, rough-vague set model based on covering is presented by integrating rough set theory and vague set theory. Covering rough-vague set is a generalized model of rough set. In order to measure the model´s uncertainty perfectly, firstly, we must consider the uncertainty produced by granular size of covering. So knowledge capacity measurement M(C) is defined to measure the uncertainty of classification capability of covering. This measurement can reflect the essential character of knowledge classification. The thinner the covering knowledge granularity is, the bigger the knowledge capacity of the covering. At the same time, compared with information entropy (the traditional method), the calculation of M(C) is simple. Then we use roughness to measure the size of borderline area of rough-vague set. Considering all the causes of uncertainty of covering rough-vague set, we introduce the definition of K-roughness to measure the model´s uncertainty effectively by combining knowledge capacity measurement and roughness. Last, we give an analyzing example for proving the accuracy and validity of this uncertainty measurement for covering rough-vague set.
  • Keywords
    pattern classification; rough set theory; classification capability; covering rough-vague set theory; knowledge capacity measurement; knowledge classification; uncertainty measurement; Area measurement; Educational institutions; Extraterrestrial measurements; Fuzzy sets; Information entropy; Information technology; Measurement uncertainty; Set theory; Size measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems and Applications (ISA), 2010 2nd International Workshop on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-5872-1
  • Electronic_ISBN
    978-1-4244-5874-5
  • Type

    conf

  • DOI
    10.1109/IWISA.2010.5473402
  • Filename
    5473402