DocumentCode
2481002
Title
Research on Uncertainty Measurement for Covering Rough-Vague Set
Author
Xu, Jiucheng ; Zhang, Qianqian ; Hu, Yuwen
Author_Institution
Coll. of Comput. & Inf. Technol., Henan Normal Univ., Xinxiang, China
fYear
2010
fDate
22-23 May 2010
Firstpage
1
Lastpage
4
Abstract
In this paper, by the research of covering rough set theory, rough-vague set model based on covering is presented by integrating rough set theory and vague set theory. Covering rough-vague set is a generalized model of rough set. In order to measure the model´s uncertainty perfectly, firstly, we must consider the uncertainty produced by granular size of covering. So knowledge capacity measurement M(C) is defined to measure the uncertainty of classification capability of covering. This measurement can reflect the essential character of knowledge classification. The thinner the covering knowledge granularity is, the bigger the knowledge capacity of the covering. At the same time, compared with information entropy (the traditional method), the calculation of M(C) is simple. Then we use roughness to measure the size of borderline area of rough-vague set. Considering all the causes of uncertainty of covering rough-vague set, we introduce the definition of K-roughness to measure the model´s uncertainty effectively by combining knowledge capacity measurement and roughness. Last, we give an analyzing example for proving the accuracy and validity of this uncertainty measurement for covering rough-vague set.
Keywords
pattern classification; rough set theory; classification capability; covering rough-vague set theory; knowledge capacity measurement; knowledge classification; uncertainty measurement; Area measurement; Educational institutions; Extraterrestrial measurements; Fuzzy sets; Information entropy; Information technology; Measurement uncertainty; Set theory; Size measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Systems and Applications (ISA), 2010 2nd International Workshop on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-5872-1
Electronic_ISBN
978-1-4244-5874-5
Type
conf
DOI
10.1109/IWISA.2010.5473402
Filename
5473402
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