DocumentCode
2481147
Title
Experimental set-up for thermopower and resistivity measurements at 100-1300 K
Author
Nakama, T. ; Burkov, A.T. ; Heinrich, A. ; Oyoshi, T. ; Yagasaki, K.
Author_Institution
Dept. of Phys., Ryukyus Univ., Okinawa, Japan
fYear
1998
fDate
24-28 May 1998
Firstpage
266
Lastpage
269
Abstract
In this paper we describe an experimental set-up for simultaneous measurements of thermopower and electrical resistivity at temperature from 100 K to 1300 K. Optimal configuration of electrodes and mechanical contacts of the thermocouples, current leads and potential probes with sample make it possible to measure a large variety of materials and result in a flexibility with respect to the sample form and dimensions. Both, bulk and thin film samples can be investigated. The measurements can be done in vacuum or in an inert gas atmosphere. Samples with resistance varying from 0 Ω up to 200 kΩ (1 GΩ in case of the resistivity measurement) can be measured. High precision and high reliability of the system have been proved during more than two years use. The resistivity and thermopower of pure Ni, CeB6 heavy fermion compound and a Cr-Si thin film composite are presented as a test material to demonstrate the possibilities and accuracy of this experimental set-up
Keywords
cerium compounds; chromium; composite materials; electrical conductivity measurement; heavy fermion systems; high-temperature techniques; low-temperature techniques; nickel; power measurement; silicon; thermoelectric power; 100 to 1300 K; CeB6; CeB6 heavy fermion compound; Cr-Si; Cr-Si thin film composite; Ni; current leads; electrodes; experimental set-up; high precision; high reliability; mechanical contacts; potential probes; pure Ni; resistivity measurements; simultaneous measurements; thermocouples; thermopower measurements; thin film; Atmospheric measurements; Conductivity measurement; Current measurement; Electric resistance; Electric variables measurement; Electrical resistance measurement; Electrodes; Mechanical variables measurement; Temperature; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
Conference_Location
Nagoya
ISSN
1094-2734
Print_ISBN
0-7803-4907-5
Type
conf
DOI
10.1109/ICT.1998.740369
Filename
740369
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