DocumentCode :
2481147
Title :
Experimental set-up for thermopower and resistivity measurements at 100-1300 K
Author :
Nakama, T. ; Burkov, A.T. ; Heinrich, A. ; Oyoshi, T. ; Yagasaki, K.
Author_Institution :
Dept. of Phys., Ryukyus Univ., Okinawa, Japan
fYear :
1998
fDate :
24-28 May 1998
Firstpage :
266
Lastpage :
269
Abstract :
In this paper we describe an experimental set-up for simultaneous measurements of thermopower and electrical resistivity at temperature from 100 K to 1300 K. Optimal configuration of electrodes and mechanical contacts of the thermocouples, current leads and potential probes with sample make it possible to measure a large variety of materials and result in a flexibility with respect to the sample form and dimensions. Both, bulk and thin film samples can be investigated. The measurements can be done in vacuum or in an inert gas atmosphere. Samples with resistance varying from 0 Ω up to 200 kΩ (1 GΩ in case of the resistivity measurement) can be measured. High precision and high reliability of the system have been proved during more than two years use. The resistivity and thermopower of pure Ni, CeB6 heavy fermion compound and a Cr-Si thin film composite are presented as a test material to demonstrate the possibilities and accuracy of this experimental set-up
Keywords :
cerium compounds; chromium; composite materials; electrical conductivity measurement; heavy fermion systems; high-temperature techniques; low-temperature techniques; nickel; power measurement; silicon; thermoelectric power; 100 to 1300 K; CeB6; CeB6 heavy fermion compound; Cr-Si; Cr-Si thin film composite; Ni; current leads; electrodes; experimental set-up; high precision; high reliability; mechanical contacts; potential probes; pure Ni; resistivity measurements; simultaneous measurements; thermocouples; thermopower measurements; thin film; Atmospheric measurements; Conductivity measurement; Current measurement; Electric resistance; Electric variables measurement; Electrical resistance measurement; Electrodes; Mechanical variables measurement; Temperature; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
Conference_Location :
Nagoya
ISSN :
1094-2734
Print_ISBN :
0-7803-4907-5
Type :
conf
DOI :
10.1109/ICT.1998.740369
Filename :
740369
Link To Document :
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