• DocumentCode
    2481195
  • Title

    An introduction to biometric-completeness: The equivalence of matching and quality

  • Author

    Phillips, P. Jonathon ; Beveridge, J. Ross

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    2009
  • fDate
    28-30 Sept. 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper introduces the concept of biometric-completeness. A problem is biometric-complete if solving the problem is ldquoequivalentrdquo to solving a biometric recognition problem. The concept of biometric-completeness is modeled on the informal concept of artificial intelligence (AI) completeness. The concept of biometric-completeness is illustrated by showing a formal equivalence between biometric recognition and quality assessment of biometric samples. The model allows for the inclusion of quality of biometric samples in verification decisions. The model includes most methods for incorporating quality into biometric systems. The key result in this paper shows that finding the perfect quality measure for any algorithm is equivalent to finding the perfect verification algorithm. Two results that follow from the main result are: finding the perfect quality measure is equivalent to solving the open-set and closed-set identification problems; and that a universal perfect quality measure cannot exist.
  • Keywords
    artificial intelligence; biometrics (access control); equivalence classes; pattern recognition; artificial intelligence completeness; biometric recognition problem; biometric-completeness; closed- set identification problem; formal equivalence; open-set identification problem; verification algorithm; Approximation algorithms; Artificial intelligence; Biometrics; Computer science; Current measurement; History; Mathematics; NP-complete problem; Pattern recognition; Quality assessment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biometrics: Theory, Applications, and Systems, 2009. BTAS '09. IEEE 3rd International Conference on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-5019-0
  • Electronic_ISBN
    978-1-4244-5020-6
  • Type

    conf

  • DOI
    10.1109/BTAS.2009.5339055
  • Filename
    5339055