Title : 
A novel profiled side-channel attack in presence of high Algorithmic Noise
         
        
            Author : 
Taha, Mostafa ; Schaumont, Patrick
         
        
            Author_Institution : 
Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
         
        
        
            fDate : 
Sept. 30 2012-Oct. 3 2012
         
        
        
        
            Abstract : 
Understanding the nature of hardware designs is a vital element in a successful Side-Channel Analysis. The inherent parallelism of these designs adds excessive Algorithmic Noise in the power consumption trace, which makes it difficult to mount a successful power attack against it. In this paper, we address this high Algorithmic Noise with a novel profiled attack that is generic and independent of any specific cryptographic algorithm. We propose both a new profiling phase and two new insights in the attack phase. The proposed profiling technique takes the high design parallelism into consideration, which results in a more accurate power model. In the attack phase, we first define two new targeted regions in the power trace, then aggregate the attack results from each of them to get a more powerful attack phase. The proposed attack model has been tested on the 128bit AES of the widely known DPA Contest (V2) and achieved a stable 80% Global Success Rate (GSR) at 2755 traces.
         
        
            Keywords : 
cryptography; power consumption; 128-bit AES; DPA contest; GSR; algorithmic noise; cryptographic algorithm; global success rate; hardware designs; high design parallelism; power attack; power consumption trace; profiled side-channel attack; profiling phase; profiling technique; side-channel analysis; Aggregates; Algorithm design and analysis; Hamming distance; Indexes; Noise; Power demand; Registers;
         
        
        
        
            Conference_Titel : 
Computer Design (ICCD), 2012 IEEE 30th International Conference on
         
        
            Conference_Location : 
Montreal, QC
         
        
        
            Print_ISBN : 
978-1-4673-3051-0
         
        
        
            DOI : 
10.1109/ICCD.2012.6378675