DocumentCode :
2481364
Title :
A MOM/FEM-based coil sensitivity mapping method for high-field parallel MRI
Author :
Jin, Jin ; Liu, Feng ; Li, Yu ; Weber, Ewald ; Xu, Wenlong ; Crozier, Stuart
Author_Institution :
Sch. of Inf. Technol. & Electr. Eng., Univ. of Queensland, Brisbane, QLD, Australia
fYear :
2011
fDate :
Aug. 30 2011-Sept. 3 2011
Firstpage :
2837
Lastpage :
2840
Abstract :
In this study, an electromagnetics-based inverse sensitivity mapping method is introduced for applications in high field MRI. Instead of using simplistic numerical approximations, the sensitivity of the radio-frequency coil was determined through a field approach by using iterative optimization. The current study is an extension to previous studies on the inverse method, which has restricted itself to low-field applications due to the use of the Biot-Savart integration to account for the H field calculations. In the current study, full-wave solutions to the Maxwell´s equations based MOM/FEM hybrid algorithm were employed to provide H field evaluation. It is demonstrated that the proposed method is able to produce high-fidelity sensitivity estimation which result in images with significantly less artefact power.
Keywords :
Maxwell equations; biomedical MRI; coils; finite element analysis; iterative methods; medical image processing; method of moments; optimisation; Biot-Savart integration; MOM-FEM hybrid algorithm; MOM-FEM-based coil sensitivity mapping method; Maxwell equation; artefact power; electromagnetic-based inverse sensitivity mapping method; full-wave solution; high field MRI; high-fidelity sensitivity estimation; high-field parallel MRI; inverse method; iterative optimization; radiofrequency coil; simplistic numerical approximation; Arrays; Coils; Fitting; Image reconstruction; Magnetic resonance imaging; Polynomials; Sensitivity; Magnetic Resonance Imaging; Radio Waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2011.6090784
Filename :
6090784
Link To Document :
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