• DocumentCode
    2481369
  • Title

    Architecture and design flow for a debug event distribution interconnect

  • Author

    Azevedo, Arnaldo ; Vermeulen, Bart ; Goossens, Kees

  • Author_Institution
    Dept. of Software & Comput. Technol., Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2012
  • fDate
    Sept. 30 2012-Oct. 3 2012
  • Firstpage
    439
  • Lastpage
    444
  • Abstract
    In this paper, we describe and analyze the architecture of the proposed Debug Event Distribution Interconnect (EDI). The EDI transmits debug events, which are 1-bit signals, between debug entities in different areas of the Network-on-Chip based Multi-Processor System-on-Chip. The EDI replicates the NoC topology with an EDI node instantiated for each underlying NoC data module. Contention in the EDI node is handled by replicating the EDI in layers. The EDI generation is automatic, and uses as input the cross-triggering patterns that are not required to follow the communication patterns in the NoC. The generation and routing tool is also presented in this paper. The EDI is evaluated with four different implementations varying complexity and handling of contention. The area of a single EDI Layer is around 0.9% of the area occupied by the tested NoCs, using the lower area implementation. These results show that the proposed implementation of the EDI incurs low cost on the overall system.
  • Keywords
    integrated circuit design; integrated circuit testing; microprocessor chips; multiprocessing systems; network routing; network-on-chip; EDI node; NoC data module; NoC testing; NoC topology; architecture; cross-triggering pattern; debug entity; debug event distribution interconnect; design flow; multiprocessor system-on-chip; network-on-chip; routing tool; Complexity theory; IP networks; Monitoring; Registers; Routing; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design (ICCD), 2012 IEEE 30th International Conference on
  • Conference_Location
    Montreal, QC
  • ISSN
    1063-6404
  • Print_ISBN
    978-1-4673-3051-0
  • Type

    conf

  • DOI
    10.1109/ICCD.2012.6378676
  • Filename
    6378676