Title :
Resonant tunneling injection lasers
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
Abstract :
Summary form only given. We report for the first time direct evidence for achieving population inversion via a resonant tunneling injection mechanism in a SCH-SQW device at 77 K. This phenomenon manifests itself in both the I-V, L-V, and L-I characteristics of the device. The I-V curves exhibit a negative differential resistance region similar to that of resonant tunneling diodes (RTDs). At the same critical field the L-V and L-I characteristics also show a substantial drop in the output power of the lasing mode, similar to the negative differential behavior of RTDs.
Keywords :
negative resistance devices; population inversion; quantum well lasers; resonant tunnelling devices; 77 K; SCH-SQW device; negative differential resistance; population inversion; resonant tunneling injection laser; Carrier confinement; Charge carrier processes; Electrons; High speed optical techniques; Laser modes; Optical refraction; Optical variables control; Photonic band gap; Radiative recombination; Resonant tunneling devices;
Conference_Titel :
Electron Devices Meeting, 1998. Proceedings. 1998 IEEE Hong Kong
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-4932-6
DOI :
10.1109/HKEDM.1998.740383