Title :
Intermittence detection in fretting corrosion studies of electrical contacts
Author :
Murrell, S.R. ; McCarthy, S.L.
Author_Institution :
Ford Res. Lab., Ford Motor Co., Dearborn, MI, USA
Abstract :
The occurrence of intermittences in electrical circuits can result in serious reliability problems particularly where low signal voltages and currents are used. It is well known that differential thermal expansion or vibration in electrical connectors can result in micromotion resulting in fretting corrosion. This can lead to an increase in contact resistance and eventual loss of electrical contact. The occurrence of electrical intermittences has been considered a precursor to contact failure associated with fretting corrosion and can cause disruption in digital circuit signals. We report the development of instrumentation that simultaneously measures the occurrence of electrical intermittences along with contact resistance during the fretting of electrical contacts. In addition, the measurement system records contact friction and normal force dynamically. Intermittences can be counted and timed with durations from 20 ns to milliseconds as a function of fretting cycles and correlated with the increase in contact resistance. All systems are integrated under LABVIEW computer control software. Measurements were made on Cu-Cu and Sn-Sn rider/flat combinations. Results will be interpreted in terms of the influence of wear debris on the electrical properties of the contacts.
Keywords :
contact resistance; corrosion testing; electric connectors; electrical contacts; friction; reliability; thermal expansion; wear; 20 ns to 1 ms; Cu-Cu; LABVIEW computer control software; Sn-Sn; contact failure; contact friction; contact resistance; differential thermal expansion; digital circuit signals; electrical connectors; electrical contacts; fretting corrosion studies; intermittence detection; low signal currents; low signal voltages; micromotion; normal force; reliability problems; rider/flat combinations; vibration; wear debris; Connectors; Contact resistance; Corrosion; Digital circuits; Electric variables measurement; Electrical resistance measurement; Force measurement; Instruments; Low voltage; Thermal expansion;
Conference_Titel :
Electrical Contacts, 1997., Proceedings of the Forty-Third IEEE Holm Conference on
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-3968-1
DOI :
10.1109/HOLM.1997.637868