DocumentCode :
2481564
Title :
On assessing the robustness of pen coordinates, pen pressure and pen inclination to time variability with personal entropy
Author :
Houmani, Nesma ; Garcia-Salicetti, Sonia ; Dorizzi, Bernadette
Author_Institution :
Dept EPH, Inst. TELECOM; TELECOM & Manage. SudParis, Evry, France
fYear :
2009
fDate :
28-30 Sept. 2009
Firstpage :
1
Lastpage :
6
Abstract :
In this work, we study different combinations of the five time functions captured by a digitizer in presence or not of time variability. To this end, we propose two criteria independent of the classification step: personal entropy, introduced in our previous works and an intra-class variability measure based on dynamic time warping. We confront both criteria to system performance using a hidden Markov model (HMM) and dynamic time warping (DTW). Moreover, we introduce the concept of short-term time variability, proposed on MCYT-100, and long-term time variability studied with BIOMET database. Our experiments clarify conflicting results in the literature and confirm some other: pen inclination angles are very unstable in presence or not of time variability; the only combination which is robust to time variability is that containing only coordinates; finally, pen pressure is not recommended in the long-term context, although it may give better results in terms of performance (according to the classifier used) in the short-term context.
Keywords :
analogue-digital conversion; entropy; handwriting recognition; hidden Markov models; BIOMET database; MCYT-100; digitizer; dynamic time warping; hidden Markov model; intraclass variability measure; pen coordinates; pen inclination; pen pressure; personal entropy; robustness; short-term time variability; time variability; Biometrics; Databases; Entropy; Handwriting recognition; Hidden Markov models; Protocols; Robustness; System performance; Telecommunications; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biometrics: Theory, Applications, and Systems, 2009. BTAS '09. IEEE 3rd International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-5019-0
Electronic_ISBN :
978-1-4244-5020-6
Type :
conf
DOI :
10.1109/BTAS.2009.5339074
Filename :
5339074
Link To Document :
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