Title :
P5H-3 A COM Analysis of SAW Tags Operating at Harmonic Frequencies
Author :
Chen, Yung-Yu ; Wu, Tsung-Tsong ; Chang, Kai-Ti
Author_Institution :
Tatung Univ., Taipei
Abstract :
The operation of surface acoustic wave (SAW) tags at harmonic modes can relax lithography restriction from the frequency raise and archive a good power handling. In this paper a simulation tool for analyzing SAW tags operating at harmonic frequencies is developed. We extended a coupling of modes (COM) model to calculate their harmonic responses by integrating the quasi-static approximation. The considered SAW tags were decimal and had reflectors of single-electrode IDT, three-finger IDT and split-electrode IDT. Finally, some related experiments were implemented: the SAW tags were by micro-electro-mechanical system processes and measured via Network analyzer and a probe station. Experimental results, showing a good agreement with simulation results, prove the feasibility of the proposed simulation tool. Based on all results, we found that the 2nd harmonic of three-finger IDT and 3rd harmonic of split-electrode IDT are effective to achieve a higher operating frequency for SAW tags.
Keywords :
approximation theory; interdigital transducers; micromachining; micromechanical devices; network analysers; radiofrequency identification; surface acoustic wave devices; COM analysis; SAW RFID system; SAW tags fabrication; conventional photolithographic fabrication; coupling-of-modes model; harmonic COM parameters; harmonic frequencies; harmonic responses; interdigital transducers; microelectro-mechanical system process; network analyzer; passive radio frequency identification system; quasistatic approximation; single-electrode IDT; split-electrode IDT; three-finger IDT; Acoustic waves; Analytical models; Frequency; Harmonic analysis; Lithography; Microelectromechanical systems; Power system harmonics; Power system modeling; Probes; Surface acoustic waves;
Conference_Titel :
Ultrasonics Symposium, 2007. IEEE
Conference_Location :
New York, NY
Print_ISBN :
978-1-4244-1384-3
Electronic_ISBN :
1051-0117
DOI :
10.1109/ULTSYM.2007.590