DocumentCode
2481596
Title
Crystal structure and magnetic susceptibility of a Ru2Si 3 single crystal
Author
Ohsugi, I.J. ; Kojima, T. ; Vining, C.B. ; Sakata, M. ; Nishida, I.A.
Author_Institution
Salesian Polytech., Tokyo, Japan
fYear
1998
fDate
24-28 May 1998
Firstpage
370
Lastpage
373
Abstract
X-ray diffraction photographic experiments and anisotropic magnetic susceptibility measurement were made to examine the crystal structure of a Ru2Si3 single crystal. The X-ray analysis revealed that the single crystal possesses a tetragonal symmetry. Some very weak X-ray diffraction spots suggest a superstructure with 4-times larger lattice constants than those of the conventional tetragonal lattice. It was found from the susceptibility measurement that the single crystal is diamagnetic at low temperatures ranging from 20 to 300 K, and that the susceptibilities are uni-axially anisotropic, which is consistent with the results of the X-ray diffraction experiments. It is concluded from the diamagnetic susceptibilities that coordinate bonding is established between Si and Ru atoms, which is consistent with the results of a previous magnetic susceptibility analysis of CrSi2
Keywords
X-ray diffraction; crystal structure; diamagnetic materials; magnetic susceptibility; ruthenium compounds; semiconductor materials; thermoelectricity; 20 to 300 K; Ru2Si3; X-ray diffraction; coordinate bonding; crystal structure; diamagnetic susceptibilities; lattice constants; magnetic susceptibility; single crystal; superstructure; tetragonal symmetry; Cameras; Diffraction; Lattices; Magnetic susceptibility; Reflection; Thermoelectricity; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
Conference_Location
Nagoya
ISSN
1094-2734
Print_ISBN
0-7803-4907-5
Type
conf
DOI
10.1109/ICT.1998.740396
Filename
740396
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