• DocumentCode
    2481636
  • Title

    Face alignment by minimizing the closest classification distance

  • Author

    Ekenel, Hazim Kemal ; Stiefelhagen, Rainer

  • Author_Institution
    Fac. of Comput. Sci., Univ. of Karlsruhe (TH), Karlsruhe, Germany
  • fYear
    2009
  • fDate
    28-30 Sept. 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper, we present a face registration approach, in which alignment is done by minimizing the closest distance at the classification step. This method eliminates the need of a feature localization step that exists in traditional face recognition systems and formulates alignment as an optimization process during classification. In other words, instead of performing a separate facial feature localization step and localizing facial features according to some type of feature matching score, in the proposed method, alignment is done by directly optimizing the classification score. Moreover, a feature detector can still be integrated to the system. In this case, the output of the feature detector is used as the initial point of the optimization process. Results of extensive experiments have shown that the proposed approach leads very high correct recognition rates, especially in the case of partial face occlusion, where it is not possible to precisely detect the facial feature locations. It has been also found that, in the case of using a facial feature detector, the approach can tolerate localization errors of up to 18% of the interocular distance.
  • Keywords
    face recognition; feature extraction; image classification; minimisation; closest classification distance; face alignment; face recognition; face registration; feature detector; feature localization; minimisation; optimization; Algorithm design and analysis; Computer vision; Detectors; Face detection; Face recognition; Facial features; Hidden Markov models; Optimization methods; Robustness; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biometrics: Theory, Applications, and Systems, 2009. BTAS '09. IEEE 3rd International Conference on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-5019-0
  • Electronic_ISBN
    978-1-4244-5020-6
  • Type

    conf

  • DOI
    10.1109/BTAS.2009.5339076
  • Filename
    5339076