• DocumentCode
    2481735
  • Title

    Thermoelectric properties of boron doped iron disilicide

  • Author

    Isoda, Y. ; Shinohara, Y. ; Imai, Y. ; Nishida, I.A. ; Ohashi, O.

  • Author_Institution
    Nat. Res. Inst. for Metals, Ibaraki, Japan
  • fYear
    1998
  • fDate
    24-28 May 1998
  • Firstpage
    390
  • Lastpage
    393
  • Abstract
    B doped β-FeSi2 has high thermal shock resistance. The effect of B doping on thermoelectric properties of β-FeSi2 has been investigated. B doped FeSi2 was a solid solution in the composition range 0<x⩽0.03. It was found that B atoms acted as donors in the whole composition range of x. The Seebeck coefficient of FeSi2 was almost six times higher and also electrical resistivity was less than a quarter by B doping, because of hopping conduction. Lattice thermal conductivity was reduced by 20% by B doping of x=0.03. Mn doped p-type FeSi2 has even lower effective maximum power Peff by B doping, while Peff of Co doped n-type samples was not affected by the doping. High thermal shock resistance was successfully given to Co doped n-type FeSi 2 by B doping
  • Keywords
    Seebeck effect; boron; electrical resistivity; hopping conduction; impurity states; iron compounds; semiconductor materials; solid solutions; thermal conductivity; thermal shock; thermoelectric power; β-FeSi2:B; B doping effects; FeSi2:B; FeSi2:Co,B; FeSi2:Mn,B; Seebeck coefficient; composition dependence; donors; effective maximum power; electrical resistivity; hopping conduction; lattice thermal conductivity; n-FeSi2:Co,B; p-FeSi2:Mn,B; solid solution; thermal shock resistance; thermoelectric properties; Boron; Doping; Electric resistance; Electric shock; Iron; Lattices; Solids; Thermal conductivity; Thermal resistance; Thermoelectricity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
  • Conference_Location
    Nagoya
  • ISSN
    1094-2734
  • Print_ISBN
    0-7803-4907-5
  • Type

    conf

  • DOI
    10.1109/ICT.1998.740401
  • Filename
    740401