A validity study of an industrial SPICE-based op-amp macromodel for high-temperature simulation

Author

Baccar, Sahbi ; Levi, Timothée ; Dallet, Dominique ; Shitikov, Vladimir ; Barbara, François

Author_Institution

IMS Lab., ENSEIRB, Talence, France

fYear

2012

fDate

13-16 May 2012

Firstpage

1294

Lastpage

1298

Abstract

This paper evaluates the validity of an industrial SPICE-based model of an operational amplifier (op-amp) for high temperature (HT) simulation purpose. A SPICE model of a commercial op-amp, which is provided by the constructor, is simulated with PSpice. More precisely, two op-amp performance parameters (the input voltage offset and the common mode rejection ratio) are simulated and compared to measurement results. The validity of the proposed SPICE op-amp model in HT is evaluated by comparing experimental measurements to SPICE model simulations and calculating the SPICE model error. A solution to overcome the limitation of this model in HT is proposed and some references are listed.

Keywords

SPICE; hardware description languages; high-temperature electronics; integrated circuit modelling; operational amplifiers; common mode rejection ratio; high-temperature simulation; industrial SPICE-based op-amp macromodel; model error; operational amplifier; validity; Computational modeling; Integrated circuit modeling; Measurement uncertainty; Operational amplifiers; SPICE; Temperature measurement; Voltage measurement; VHDL-AMS; high temperature; model; op-amp; spice; validity;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International

Conference_Location

Graz

ISSN

1091-5281

Print_ISBN

978-1-4577-1773-4

Type

conf

DOI

10.1109/I2MTC.2012.6229463

Filename

6229463