Title :
A validity study of an industrial SPICE-based op-amp macromodel for high-temperature simulation
Author :
Baccar, Sahbi ; Levi, Timothée ; Dallet, Dominique ; Shitikov, Vladimir ; Barbara, François
Author_Institution :
IMS Lab., ENSEIRB, Talence, France
Abstract :
This paper evaluates the validity of an industrial SPICE-based model of an operational amplifier (op-amp) for high temperature (HT) simulation purpose. A SPICE model of a commercial op-amp, which is provided by the constructor, is simulated with PSpice. More precisely, two op-amp performance parameters (the input voltage offset and the common mode rejection ratio) are simulated and compared to measurement results. The validity of the proposed SPICE op-amp model in HT is evaluated by comparing experimental measurements to SPICE model simulations and calculating the SPICE model error. A solution to overcome the limitation of this model in HT is proposed and some references are listed.
Keywords :
SPICE; hardware description languages; high-temperature electronics; integrated circuit modelling; operational amplifiers; common mode rejection ratio; high-temperature simulation; industrial SPICE-based op-amp macromodel; model error; operational amplifier; validity; Computational modeling; Integrated circuit modeling; Measurement uncertainty; Operational amplifiers; SPICE; Temperature measurement; Voltage measurement; VHDL-AMS; high temperature; model; op-amp; spice; validity;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location :
Graz
Print_ISBN :
978-1-4577-1773-4
DOI :
10.1109/I2MTC.2012.6229463
