• DocumentCode
    2481843
  • Title

    Carrier density behaviour during ageing of doped plasma spray formed iron disilicide [thermoelectric material]

  • Author

    Schackenberg, K. ; Müller, E. ; Schilz, J. ; Ernst, Herbert ; Kaysser, W.A.

  • Author_Institution
    Inst. of Mater. Res., German Aerosp. Center, Koln, Germany
  • fYear
    1998
  • fDate
    24-28 May 1998
  • Firstpage
    422
  • Lastpage
    425
  • Abstract
    The relations between the microstructure and the thermoelectric transport properties of plasma spray formed FeSi2:Al and FeSi 2:Co have been investigated in order to identify process variations and spraying conditions to obtain an advantageous thermoelectric performance. Samples from two different plasma spraying techniques have been compared to hot pressed FeSi2. The characterisation of the material comprises the determination of the phase composition by XRD, and measurements of the Hall mobility, the charge carrier density, the Seebeck coefficient and the electrical and thermal conductivity. The long term stability has been investigated in a consecutive heat treatment at 800°C, lasting up to 1000 h
  • Keywords
    aluminium; carrier density; cobalt; iron alloys; plasma arc sprayed coatings; plasma arc spraying; silicon alloys; thermoelectric conversion; thermoelectricity; 1000 h; 800 C; FeSi2; FeSi2:Al; FeSi2:Co; Hall mobility measurement; Seebeck coefficient; XRD; carrier density behaviour; characterisation; charge carrier density; electrical conductivity; heat treatment; long term stability; phase composition; plasma spray formation; plasma spraying techniques; process variations; spraying conditions; thermal conductivity; thermoelectric material; Aging; Charge carrier density; Composite materials; Microstructure; Plasma density; Plasma properties; Plasma transport processes; Thermal conductivity; Thermal spraying; Thermoelectricity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
  • Conference_Location
    Nagoya
  • ISSN
    1094-2734
  • Print_ISBN
    0-7803-4907-5
  • Type

    conf

  • DOI
    10.1109/ICT.1998.740408
  • Filename
    740408