Title :
Non-enumerative generation of statistical path delays for ATPG
Author :
Somashekar, Ahish Mysore ; Tragoudas, Spyros ; Gangadhar, Sreenivas ; Jayabharathi, Rathish
Author_Institution :
ECE Dept., Southern Illinois Univ., Carbondale, IL, USA
fDate :
Sept. 30 2012-Oct. 3 2012
Abstract :
A Monte Carlo based approach capable of identifying the probability distributions that describe the delay of every sensitizable path in a path implicit manner is proposed. It is shown experimentally that the statistical information for all paths is generated as fast as the traditional Monte Carlo simulation that identifies the probability density function for the circuit delay.
Keywords :
Monte Carlo methods; automatic test pattern generation; binary decision diagrams; circuit testing; delay circuits; delays; logic testing; statistical distributions; ATPG; Monte Carlo based approach; Monte Carlo simulation; circuit delay; nonenumerative generation; probability density function; probability distribution; sensitizable path delay; statistical information; statistical path delay; Circuit faults; Data structures; Delay; Logic gates; Monte Carlo methods; Probability distribution; USA Councils;
Conference_Titel :
Computer Design (ICCD), 2012 IEEE 30th International Conference on
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-3051-0
DOI :
10.1109/ICCD.2012.6378700
