Title :
TE generator test facility for low resistance single elements
Author :
Müller, E. ; Bruch, J.U. ; Schilz, J.
Author_Institution :
Inst. of Mater. Res., German Aerosp. Center, Koln, Germany
Abstract :
A test facility for thermoelectric (TE) generator modules and graded TE elements has been developed. Reference blocks for the heat flow measurement are serially connected to the sample. Special constructive solutions prevent a disturbance of the heat flux distribution by radiation. Different thermal greases have been used to obtain a good thermal contact between sample and reference. For the characterisation of electrically loaded single element generators as well as graded TE elements a fine tuning of low resistive loads is required. A computer controllable resistive load has been built up for this purpose. A series of FeSi2 generators has been manufactured and tested. Thermopower, resistance, thermal conductance, and efficiency have been measured for a hot side temperature up to 600°C, keeping the cold side near room temperature. After minor modification of the apparatus, the properties of graded model systems can be measured to draw a comparison with model calculations
Keywords :
electric resistance measurement; heat transfer; iron alloys; silicon alloys; test facilities; thermal conductivity measurement; thermoelectric conversion; thermoelectric devices; 600 C; FeSi2; FeSi2 generators; cold side; computer controllable resistive load; efficiency measurement; electrically loaded single element generators; heat flow measurement; heat flux distribution disturbance; low resistance single elements; low resistive loads; resistance measurement; test facility; thermal conductance measurement; thermal contact; thermal greases; thermoelectric generator modules; thermopower measurement; Character generation; Contacts; Electrical resistance measurement; Fluid flow measurement; Manufacturing; Tellurium; Temperature; Test facilities; Thermal resistance; Thermoelectricity;
Conference_Titel :
Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
Conference_Location :
Nagoya
Print_ISBN :
0-7803-4907-5
DOI :
10.1109/ICT.1998.740413