DocumentCode
2482163
Title
Learning Metrics for Shape Classification and Discrimination
Author
Fan, Yu ; Houle, David ; Mio, Washington
Author_Institution
Dept. of Math., Florida State Univ., Tallahassee, FL, USA
fYear
2010
fDate
23-26 Aug. 2010
Firstpage
2652
Lastpage
2655
Abstract
We propose a family of shape metrics that generalize the classical Procrustes distance by attributing weights to general linear combinations of landmarks. We develop an algorithm to learn a metric that is optimally suited to a given shape classification problem. Shape discrimination experiments are carried out with phantom data, as well as landmark data representing the shape of the wing of different species of fruit flies.
Keywords
image classification; learning (artificial intelligence); shape recognition; fruit flies; learning metrics; shape classification; shape discrimination; shape metrics; Eigenvalues and eigenfunctions; Measurement; Orbits; Phantoms; Shape; Symmetric matrices; Training; landmarks; shape; shape metrics;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location
Istanbul
ISSN
1051-4651
Print_ISBN
978-1-4244-7542-1
Type
conf
DOI
10.1109/ICPR.2010.650
Filename
5596013
Link To Document