• DocumentCode
    2482163
  • Title

    Learning Metrics for Shape Classification and Discrimination

  • Author

    Fan, Yu ; Houle, David ; Mio, Washington

  • Author_Institution
    Dept. of Math., Florida State Univ., Tallahassee, FL, USA
  • fYear
    2010
  • fDate
    23-26 Aug. 2010
  • Firstpage
    2652
  • Lastpage
    2655
  • Abstract
    We propose a family of shape metrics that generalize the classical Procrustes distance by attributing weights to general linear combinations of landmarks. We develop an algorithm to learn a metric that is optimally suited to a given shape classification problem. Shape discrimination experiments are carried out with phantom data, as well as landmark data representing the shape of the wing of different species of fruit flies.
  • Keywords
    image classification; learning (artificial intelligence); shape recognition; fruit flies; learning metrics; shape classification; shape discrimination; shape metrics; Eigenvalues and eigenfunctions; Measurement; Orbits; Phantoms; Shape; Symmetric matrices; Training; landmarks; shape; shape metrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2010 20th International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-7542-1
  • Type

    conf

  • DOI
    10.1109/ICPR.2010.650
  • Filename
    5596013