Title :
Learning Metrics for Shape Classification and Discrimination
Author :
Fan, Yu ; Houle, David ; Mio, Washington
Author_Institution :
Dept. of Math., Florida State Univ., Tallahassee, FL, USA
Abstract :
We propose a family of shape metrics that generalize the classical Procrustes distance by attributing weights to general linear combinations of landmarks. We develop an algorithm to learn a metric that is optimally suited to a given shape classification problem. Shape discrimination experiments are carried out with phantom data, as well as landmark data representing the shape of the wing of different species of fruit flies.
Keywords :
image classification; learning (artificial intelligence); shape recognition; fruit flies; learning metrics; shape classification; shape discrimination; shape metrics; Eigenvalues and eigenfunctions; Measurement; Orbits; Phantoms; Shape; Symmetric matrices; Training; landmarks; shape; shape metrics;
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
Print_ISBN :
978-1-4244-7542-1
DOI :
10.1109/ICPR.2010.650