DocumentCode :
2482346
Title :
Wide dynamic range CMOS active pixel sensor using a stacked-photodiode structure
Author :
Jo, Sung-Hyun ; Bae, Myunghan ; Shin, Jang-Kyoo
Author_Institution :
Sch. of Electron. Eng., Kyungpook Nat. Univ., Daegu, South Korea
fYear :
2012
fDate :
13-16 May 2012
Firstpage :
1378
Lastpage :
1381
Abstract :
In this paper, we propose a stacked-photodiode structure to extend the dynamic range of the CMOS active pixel sensor (APS). The proposed APS uses two photodiodes with different sensitivities and two additional MOSFETs in comparison with a conventional 3-transistor APS. Although the size of pixel is slightly larger than that of conventional 3-transistor APS, extension of the dynamic range is much easier than conventional methods by adjusting the reference voltage. The dynamic range of the proposed APS was greater than 103 dB. The designed circuit has been fabricated by using 0.35 μm 2-poly 4-metal standard CMOS technology and its characteristics have been evaluated.
Keywords :
CMOS image sensors; MOSFET; photodiodes; 2-poly 4-metal standard CMOS technology; conventional 3-transistor APS; size 0.34 mum; stacked-photodiode structure; two additional MOSFET; wide dynamic range CMOS active pixel sensor; CMOS image sensors; CMOS integrated circuits; CMOS technology; Dynamic range; Lighting; Photodiodes; Sensitivity; dyanmic range; feedback structure; stacked-photodiode;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location :
Graz
ISSN :
1091-5281
Print_ISBN :
978-1-4577-1773-4
Type :
conf
DOI :
10.1109/I2MTC.2012.6229496
Filename :
6229496
Link To Document :
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