Title :
Wide dynamic range CMOS active pixel sensor using a stacked-photodiode structure
Author :
Jo, Sung-Hyun ; Bae, Myunghan ; Shin, Jang-Kyoo
Author_Institution :
Sch. of Electron. Eng., Kyungpook Nat. Univ., Daegu, South Korea
Abstract :
In this paper, we propose a stacked-photodiode structure to extend the dynamic range of the CMOS active pixel sensor (APS). The proposed APS uses two photodiodes with different sensitivities and two additional MOSFETs in comparison with a conventional 3-transistor APS. Although the size of pixel is slightly larger than that of conventional 3-transistor APS, extension of the dynamic range is much easier than conventional methods by adjusting the reference voltage. The dynamic range of the proposed APS was greater than 103 dB. The designed circuit has been fabricated by using 0.35 μm 2-poly 4-metal standard CMOS technology and its characteristics have been evaluated.
Keywords :
CMOS image sensors; MOSFET; photodiodes; 2-poly 4-metal standard CMOS technology; conventional 3-transistor APS; size 0.34 mum; stacked-photodiode structure; two additional MOSFET; wide dynamic range CMOS active pixel sensor; CMOS image sensors; CMOS integrated circuits; CMOS technology; Dynamic range; Lighting; Photodiodes; Sensitivity; dyanmic range; feedback structure; stacked-photodiode;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location :
Graz
Print_ISBN :
978-1-4577-1773-4
DOI :
10.1109/I2MTC.2012.6229496