Title : 
Spatial hole burning effects in gain-guided vertical cavity laser diodes
         
        
            Author : 
Michalzik, R. ; Ebeling, K.J.
         
        
            Author_Institution : 
Dept. of Optoelectron., Ulm Univ., Germany
         
        
        
        
        
        
            Abstract : 
Many of the numerous applications of vertical cavity laser diodes being nowadays under discussion require single transverse mode emission behavior. A quantitative understanding of the factors limiting the maximum achievable single-mode output power is thus vital for further device optimization. We have theoretically investigated the effects of spatial hole burning in the active zone on the emission characteristics of gain-guided AlAs-GaAs DBR laser diodes in a self-consistent manner. The small single-mode power of low threshold devices can be attributed to strong hole burning induced by the excessively enhanced internal electric field
         
        
            Keywords : 
III-V semiconductors; aluminium compounds; electric field effects; electro-optical effects; gallium arsenide; laser cavity resonators; laser modes; laser theory; optical hole burning; semiconductor device models; semiconductor lasers; surface emitting lasers; AlAs-GaAs; active zone; device optimization; emission characteristics; excessively enhanced internal electric field; gain-guided AlAs-GaAs DBR laser diodes; gain-guided vertical cavity laser diodes; low threshold devices; maximum achievable single-mode output power; self-consistent manner; single transverse mode emission behavior; small single-mode power; spatial hole burning effects; Diode lasers; Equations; Laser modes; Laser tuning; Mirrors; Optical resonators; Power generation; Protons; Ring lasers; Vertical cavity surface emitting lasers;
         
        
        
        
            Conference_Titel : 
Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
         
        
            Conference_Location : 
San Jose, CA
         
        
            Print_ISBN : 
0-7803-1263-5
         
        
        
            DOI : 
10.1109/LEOS.1993.379306