• DocumentCode
    2482543
  • Title

    Switching rate changes associated with mental fatigue for assistive technologies

  • Author

    Craig, Ashley ; Tran, Yvonne ; Wijesuriya, Nirupama ; Thuraisingham, Ranjit ; Nguyen, Hung

  • Author_Institution
    Rehabilitation Studies Unit, Univ. of Sydney, Sydney, NSW, Australia
  • fYear
    2011
  • fDate
    Aug. 30 2011-Sept. 3 2011
  • Firstpage
    3071
  • Lastpage
    3074
  • Abstract
    This paper presents research that investigated the effects of mental fatigue on brain activity associated with eyes open and eyes closed conditions. The changes associated with electroencephalography (EEG) alpha wave activity (8-13Hz) during eye closure has previously been shown to be an effective strategy for switching and activating devices as an environmental control system (ECS) designed for people with severe disability like spinal cord injury (SCI). The results showed that switching times did increase due to fatigue, however, these increases were not large (around 1 second longer to switch) and this difference was not significant. When baselines were readjusted taking into account the change in alpha wave activity due to the fatigue, switching reduced to times typically seen when the person was alert. Error rates were similar between the alert and fatigue sates. Implications of these results for a hands-free ECS are discussed.
  • Keywords
    electroencephalography; error analysis; eye; injuries; medical control systems; neurophysiology; EEG; brain activity; electroencephalography alpha wave activity; environmental control system; error rates; eye opening-closing condition; frequency 8 Hz to 13 Hz; mental fatigue effects; severe disability; spinal cord injury; switching rate change; Brain; Educational institutions; Electroencephalography; Fatigue; Switches; TV; Brain; Cognition; Electroencephalography; Fatigue; Fourier Analysis; Humans;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4121-1
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2011.6090839
  • Filename
    6090839